Monday, December 16, 2013
Eureka2s Mobile DRAM Tester
CST is proud to announce the latest Mobile Memory Chip Test Solution. CST Eureka2s is a new platform dedicated to test Mobile memory chips. With different DUT modules, it can test LP-DDR2, LP-DDR3 low power DRAMs before they go onto the system board. It has 23 different test patterns to cycle out critical DRAM problems. It has fine micro-Amp level current probe to verify lowest power consumption on standby mode and deep sleep mode. It comes with advanced diagnostic features like graphical error bit map display and Shmoo plot. For further information, please contact info[@] or call us at +1-972-241-2662.
The Eureka2s Test System is a MCP Chip tester capable of testing LP-DDR, LP-DDR2, LP-DDR3, NAND/NOR memory chips. It utilizes CST‘s proprietary test algorithm to capture all known memory failures.
The tester offers significant advanced programmable features, wide Vdd voltage range, shmoo plot, graphical error capture plus high frequency testing up to 1600Mhz data rate.
Some of the Eureka2 MCP Tester Key Features
- Support LP-DDR1, LP-DDR2,LP-DDR3
- Support NAND/NOR Flash Memory
- Fault Focusing algorithm to pin-point bad chips
- Wide Vdd voltage setting for testing DRAM and Flash Memory
- Programmable Timing Adjustment - 50ps resolution
- 8 ~ ICC measurement
- DRAM/Flash Speed Sorting
- CROSS-Talk Check for Signal integrity problems on DRAM/FLash pins
- Extensive JEDEC Device Library
- Graphical Error Capture Display
- Shmoo Plot for test record and analysis
The Eureka2s Memory Chip Tester is built to work with DUT module extensions. It allows user to swap inter-changeable ,LP-DDR3,LP- DDR3 and DDR2 DUT test modules. With a simple push-button and a mouse click, the Eureka2s tester quickly auto-identify and displays the memory size, clock frequency, and speed of the DRAM/FLASH memory chip.
The new “Eureka2s "MCP" Memory tester provides added troubleshooting capability for the present and future MCP memories at affordable prices. It is targeted for OEM manufacturers for Mobile 大众彩票登录Phone application. It is indeed the fastest tester and the easiest to use in its class.
The Eureka2s- MCP Memory tester is available for immediate ordering. Prices starts at U$20,000.
Download Eureka2 MCPs Memory Tester from this link :
Call 972-2412662 for more information.
Founded in 1983, CST develops, market, and support computer memory tester software and hardware. CST pioneered the first low cost SIMM tester in 1985. Since then, CST testers have become the standard for the computer manufacturing industry, holding more than 70% of the market in testers for computer manufacturers and third party SIMM manufacturers. With its product lines of DIMM memory testers and handlers, CST is equipped to handle all aspects of memory testing. CST has a comprehensive line of testers ranging from the low-volume service tester to the high-volume manufacturing needs.
CST, Inc. headquarters in Dallas, Texas, USA also has direct offices in Singapore, California, China大众彩票app下载 as well as global distributors strategically located in Australia, Brazil, Canada, China大众彩票app下载, France, Germany, Hong Kong, Japan, Korea, Switzerland, Sweden, Taiwan,Israel,Spain,Portugal and the United Kingdom.
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